Left: Marc Allaire loading an alignment tool at the beamline. Right: A crystallography diffraction pattern obtained from a crystal of S309.(Credit: Marilyn Sargent & Marc Allaire/Berkeley Lab)
Left: Marc Allaire loading an alignment tool at the beamline. Right: A crystallography diffraction pattern obtained from a crystal of S309.(Credit: Marilyn Sargent & Marc Allaire/Berkeley Lab)