Left: Marc Allaire loading an alignment tool at the beamline. Right: A crystallography diffraction pattern obtained from a crystal of S309.(Credit: Marilyn Sargent & Marc Allaire/Berkeley Lab)
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Left: Marc Allaire loading an alignment tool at the beamline. Right: A crystallography diffraction pattern obtained from a crystal of S309.(Credit: Marilyn Sargent & Marc Allaire/Berkeley Lab)
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